Scanning Tunneling Microscopy and Atomic Force Microscopy
| RIKEN Review No.7 ( October, 1994 )
Scanning Tunneling Microscopy and Atomic Force Microscopy |
|
| Category | Title | Author | pp.x-x | |
| Spot | Seeing or touching is believing | M.Aono | p.1 |  |
| R & Tech. Review | Formation of intrinsic defects during the growth of CaF on Si(111) studied by STM | T.Nakayama, M.Katayama, G.Selva, and M.Aono | pp.3-4 | |
| R & Tech. Review | Continual structural evolution of the Si(111)6~6-Au surface studied by scanning tunneling microscopy | T.Takami, D.Fukushi, T.Nakayama, Y.Kuwahara, M.Uda, and M.Aono | pp.5-6 | |
| R & Tech. Review | Hydrogen-induced reconstructed structures on Pd(110) at temperatures from 100 K to 300 K | J.Yoshinobu, H.Tanaka, and M.Kawai | pp.7-8 | |
| R & Tech. Review | Additional dimer-row structure of 3C-SiC(001) surfaces | S.Hara, S.Misawa, S.Yoshida, and Y.Aoyagi | pp.9-10 | |
| R & Tech. Review | Acetylene adsorption on Si(111)(7x7) | J.Yoshinobu and M.Aono | pp.11-12 | |
| R & Tech. Review | Anchoring phase and scanning tunneling microscopy | Y.Iwakabe and M.Hara | pp.13-14 | |
| R & Tech. Review | Rectification of a monolayer-Ga/n-Si(111) diode observed by scanning tunneling microscopy | T.Hanada, T.Shiokawa, Y.Aoyagi, and T.Sugano | pp.15-16 | |
| R & Tech. Review | Excitation of atomic motion by a scanning tunneling microscope tip on the Si(111) surface | T.Nakayama, T.Eguchi, and M.Aono | pp.17-18 | |
| R & Tech. Review | Structural analyses of biological membranes by atomic force microscopy | T.Kouyama, T.Okada, and J.-Y.Wang | pp.19-20 | |
| R & Tech. Review | In-situ observation of lithography by atomic force microscope | T.Shiokawa, T.Hanada, M.Shigeno, T.Sugano, and Y.Aoyagi | pp.21-22 | |
