SR Materials Science Instrumentation Unit

New discovery is frequently correlated with new methodology and the development of measurement system. The SR materials science instrumentation unit is primarily responsible for maintaining and managing RIKEN beamlines of BL19LXU and BL44B2 at the SPring-8 synchrotron radiation facility. In addition, the unit is responsible for the development and improvement of various technologies for advanced materials science research, especially for materials dynamics by means of time-resolved measurement methods at the RIKEN beamlines. The unit will also contribute to development of new technology, which is useful for the experiments using the intense pulsed X-rays produced from SACLA.

Research Subjects

• Development of advanced X-ray measurement methods using the SPring-8 beamlines
• Investigation of material properties using intense pulsed X-ray from SACLA
• Sample monitoring system and quick switching system of users' SR experiments
• Management and operation of RIKEN beamlines for SR experiments on material science

Publications

1. Y. Tanaka, K. Ito, T. Nakatani, R. Onitsuka, M. Newton, T. Sato, T. Togashi, M. Yabashi, T. Kawaguchi, K. Shimada, K. Tokuda, I. Takahashi, T. Ichitsubo, E. Matsubara, Y. Nishino:
   "Time-resolved Bragg coherent X-ray diffraction revealing ultrafast lattice dynamics in nano-thickness crystal layer using X-ray free electron laser"
   The Journal of the Ceramic Society of Japan, 121 No. 1411 (2013)
2. A. Nisawa, Y. Yoneda, G. Ueno, H. Murakami, Y. Okajima, K. Yamamoto, Y. Senba, K. Uesugi, Y. Tanaka, M. Yamamoto, S. Goto, T. Ishikawa:
   "Saggital focusing of synchrotron radiation X-rays using winged crystal"
   J. Synchrotron Rad. 20, pp.219-225 (2013)
3. T. Hoshino, Y. Tanaka, H. Jinnai, A. Takahara:
   "Surface and Interface Analyses of Polymer Brushes by Synchrotron Radiation"
   J. Phys. Soc. Jpn. 82, 021014 (2013)
4. Y. Tanaka, Y. Uozaki, K. Nozaki, K. Ito, K. Yamasaki, H. Terauchi, I. Takahashi, K. Tahara, T. Ishikawa:
   "Time-resolved X-ray diffraction studies of laser induced acoustic pulse generation in semiconductors using synchrotron radiation"
   J. Phys. Conf. Ser., 278, 012018 (2011)
5. Y. Nishino, Y. Tanaka, M. Okada, M. Okaya, Y. Uozaki, K. Nozaki, M. Yabashi, M. Nagasono, S. Matsui, T. Ishikawa and E. Matsubara:
   "Femtosecond Snapshot Holography with Extended Reference Using Extreme Ultraviolet Free-Electron Laser"
   Appl. Phys. Express, 3, pp.10271-1-3 (2010)
6. Y. Tanaka, Y. Fukuyama, N. Yasuda, J. Kim, H. Murayama, S. Kohara, H. Osawa, T. Nakagawa, S. Kimura, K. Kato, F. Yoshida, H. Kamioka, Y. Moritomo, T. Matsunaga, R. Kojima, N. Yamada, K. Toriumi, T. Ohshima, H. Tanaka, M. Takata:
   "Development of Picosecond Time-Resolved Microbeam X-Ray Diffraction Technique for Investigation of Optical Recording Process"
   Jpn. J. Appl. Phys., 48, .03A001 (2009)
7. Y. Fukuyama, N. Yasuda, J. Kim, H. Murayama, Y. Tanaka, S. Kimura, K. Kato, S. Kohara, Y. Moritomo, T. Matsunaga, R. Kojima, N. Yamada, H. Tanaka, T. Ohshima, M. Takata:
   "Time-Resolved Investigation of Nanosecond Crystal Growth in Rapid-Phase-Change Materials: Correlation with the Recording Speed of Digital Versatile Disc Media"
   Appl. Phys. Express, 1, p.045001 (2008)
8. G. Lambert, T. Hara, D. Garzella, T. Tanikawa, M. Labat, B. Carre, H. Kitamura, T. Shintake, M. Bougeard, S. Inoue, Y. Tanaka, P. Salieres, H. Merdji, O. Chubar, O. Gobert, K. Tahara, M.-E. Couprie
   "Injection of harmonics generated in gas in a free-electron-laser providing intense and coherent extreme-ultraviolet light"
   Nature Phys., 4, pp.296-300 (2008)
9. Fukuyama, Y., Yasuda, N., Kim, J., Murayama, H., Ohshima, T., Tanaka, Y., Kimura, S., Kamioka, H., Moritomo, Y., Toriumi, K., Tanaka, H., Kato, K., Ishikawa, T., Takata. M.:
   "Ultra-high-precision time control system over any long time delay for laser pump and synchrotron x-ray probe experiment"
   Rev. Sci. Instrum. 79, p.045107 (2008)
10. Y. Hayashi, Y. Tanaka, T., Kirimura, N. Tsukuda, E. Kuramoto, T. Ishikawa:
    "Acoustic pulse echoes probed with time-resolved x-ray triple-crystal diffractometry"
    Phys. Rev. Lett., 96, 115505 (2006)